University of Technology, Sydney

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68320 Scanning Probe and Electron Microscopy

6cp; 6hpw
Requisite(s): 68606 Solid-state Science and Nanodevices
These requisites may not apply to students in certain courses. See access conditions.

Description

Characterisation and fabrication of nano-materials and nano-devices requires analysis and manipulation tools with extreme precision. This is a central issue in nanotechnology and many contemporary areas of materials physics. The advent of techniques, such as scanning tunnelling or atomic force microscopy allows us to view, analyse and manipulate objects at this level. Scanning electron microscopy and transmission electron microscopy have a more established history, but in more recent times have turned out to be invaluable tools to the nanotechnologist. This subject introduces the concepts behind current nano-scale analytical microscopy techniques as well as their use and application in many areas of science and technology. Recent developments in the techniques are introduced, and students have the opportunity to gain experience using a variety of scanning probe and electron microscopy techniques.

Typical availability

Spring session, City campus


Detailed subject description.

Fee information

Information to assist with determining the applicable fee type can be found at Understanding fees.

Access conditions

Note: The requisite information presented in this subject description covers only academic requisites. Full details of all enforced rules, covering both academic and admission requisites, are available at access conditions and My Student Admin.